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Khizr
Siddique

Nanotechnology Engineering · UWaterloo

Nanotechnology Engineering · University of Waterloo

Khizr
Siddique

Building at the intersection of hardware and software, from semiconductors and embedded systems to production-grade full-stack infrastructure and ML tooling.

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Engineering with
depth.

I'm a Nanotechnology Engineering student at the University of Waterloo, currently in 2B. My work spans two tracks: hardware - materials characterisation, semiconductor devices, embedded systems, BMS design - and software - production Flask/Python infrastructure, SQL at scale, React, node.js and LLM tooling.

Four co-op terms at Loblaw, CIBC, Bora Pharmaceuticals, and Smurfit WestRock have grounded my engineering in real production environments.

4
Co-op Terms
3A
Year at UW
6+
Shipped Projects
Build Velocity
Khizr Siddique

Where I've
worked.

Jan – Apr 2026
Loblaw Companies
Software Engineering Intern

Built production Flask/Python infrastructure for the Replenishment Optimization team. Migrated legacy PHP tools to blueprint architecture, implemented multithreading (30 s → 8 s), resolved a memory crash via chunked Pandas.

PythonFlask Teradata SQLMultithreadingOracle
Sept – Dec 2025
CIBC
Software Engineering Intern — PMO

Built and maintained Power BI dashboards and data pipelines for portfolio management. Drove reporting automation across program delivery teams.

Power BISQLData Engineering
Jan – April 2025
Bora Pharmaceuticals
Project Management / Operations

Supported project delivery and operations coordination across pharmaceutical manufacturing workflows.

Project ManagementOperations
May – Aug 2024
Smurfit WestRock
Process Engineering Intern

Manufacturing process engineering and quality analysis in a large-scale packaging environment.

Process EngineeringManufacturing

What I
know.

Python JavaScript TypeScript React Flask Node.js SQL REST APIs Git Vite Supabase SQLite Python JavaScript React Flask Node.js SQL REST APIs Git Vite Supabase SQLite
SolidWorks OpenCL CUDA STM32 Semiconductor Physics Band Theory BMS Design PN Junctions MOSFETs XRD / SEM Spectroscopy MATLAB SolidWorks OpenCL CUDA STM32 Semiconductor Physics Band Theory BMS Design PN Junctions MOSFETs XRD / SEM Spectroscopy MATLAB
Power BI Pandas Teradata MS Office GitHub Apps JWT / HMAC Claude API LLM Tooling Multithreading ETL Pipelines 3D Printing Fusion 360 Power BI Pandas Teradata MS Office GitHub Apps JWT / HMAC Claude API LLM Tooling Multithreading ETL Pipelines 3D Printing Fusion 360

Things I've
built.

Academic
lab work.

NE 242 / 01
MOSFET Characterisation & Body Effect
Semiconductor Physics & Devices

Measured threshold voltage shift under body bias. Extracted transconductance and output resistance from I–V curves. Identified subthreshold slope and channel-length modulation.

MOSFETI–V CurvesBody EffectThreshold Voltage
NE 242 / 02
PN Junction & Zener / Avalanche Breakdown
Semiconductor Physics & Devices

Characterised forward and reverse I–V curves of silicon diodes. Identified Zener and avalanche breakdown regimes and extracted ideality factor and reverse saturation current.

PN JunctionZenerAvalancheDiode I–V
NE 242 / 03
Optical Band Gap & LED Emission Spectra
Semiconductor Physics & Devices

Measured optical transmission spectra to extract band gap energies. Characterised LED L–I curves and emission spectra using an Ocean Optics FLAME-S spectrometer.

Band GapSpectroscopyLEDFLAME-S
NE 242 / 04
Four-Point Probe & Sheet Resistance
Semiconductor Physics & Devices

Used hot probe and four-point probe techniques to determine semiconductor type and measure resistivity. Calculated sheet resistance and compared doping concentrations across samples.

Four-Point ProbeHot ProbeResistivitySheet Resistance
NE 226 / 01
Wave Optics — Interference & Polarisation
Electromagnetic Fields & Waves

Analysed plane wave propagation, thin-film interference, and atomic polarisation. Calculated intensity patterns for double-slit and thin-film configurations with phase analysis.

Wave OpticsInterferencePolarisationPlane Waves
NE 226L / 01
UV-Visible Spectroscopy & CdSe Nanoparticle Sizing
Material Characterization Methods

Built a Beer-Lambert calibration curve for methylene blue (R²=0.9922, ε=74.727 mM⁻¹cm⁻¹). Extracted optical band gaps from CdSe nanoparticle absorption spectra and calculated particle diameters (1.6–2.4 nm) using a 5th-degree polynomial fit.

UV-VisBeer-LambertCdSeBand Gap
NE 226L / 02
FTIR Spectroscopy
Material Characterization Methods

Identified an unknown compound as ibuprofen via IR peak analysis — O-H stretch at 3287 cm⁻¹, C=O at 1613 cm⁻¹, aromatic C=C at 1600 cm⁻¹. Compared Nujol vs KBr sample prep and analysed SNR scaling with scan count (SNR ∝ √n).

FTIRATRIbuprofen IDSNR Analysis
NE 226L / 03
Raman Spectroscopy — InO₃ & SWNT Characterisation
Material Characterization Methods

Measured SNR at 5 s and 25 s integration times for InO₃ nanoparticles (SNR: 0.269 → 1.464), confirming SNR ∝ √t. Calculated SWNT radii from RBM peaks (0.38–0.73 nm). Optimised laser power, objective, and integration time for nanoparticle Raman analysis.

RamanSWNTInO₃RBM
NE 226L / 04
Ellipsometry — Polystyrene Thin Film Thickness
Material Characterization Methods

Measured optical constants and thickness of SiN and polystyrene films spin-coated at 500–1000 RPM with 1–3 wt% concentration. Confirmed thickness scales with concentration and inversely with spin speed (range: 1019–3656 Å). Modelled bilayer PS/SiNx stacks.

EllipsometryThin FilmsSpin CoatingPolystyrene
NE 226L / 05
Scanning Electron Microscopy — Resolution & Imaging Modes
Material Characterization Methods

Optimised SEM imaging on a Hitachi S-3500N across low, medium, and high magnifications. Compared secondary electron vs backscattered electron imaging modes. Identified thermionic gun brightness as the primary resolution bottleneck and mitigated charging via conductive coating.

SEMSE / BSE ImagingHitachi S-3500NResolution
NE 226L / 06
X-Ray Diffraction — TiO₂ Phase Transition & Scherrer Analysis
Material Characterization Methods

Identified anatase TiO₂ pre-bake and confirmed anatase-to-rutile phase transition post-bake via peak shifts at 2θ=27.34°. Calculated crystallite sizes using the Scherrer equation: Si (95.9 nm), anatase (80.1 nm), rutile nanopowder (22.0 nm). Discussed instrumental broadening correction across XRD systems.

XRDTiO₂Scherrer EquationPhase Transition

Open to
opportunities.

Actively seeking Fall 2026 co-op/internship positions across SWE, embedded, ML, and hardware tracks.