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Nanotechnology Engineering · UWaterloo
Building at the intersection of hardware and software — from semiconductor physics and embedded systems to production-grade full-stack infrastructure and ML tooling.
I'm a Nanotechnology Engineering student at the University of Waterloo,
currently in 2B. My work spans two tracks: hardware - materials
characterisation, semiconductor devices, embedded systems, BMS design - and
software - production Flask/Python infrastructure, SQL at scale,
React, node.js and LLM tooling.
Four co-op terms at Loblaw, CIBC, Bora Pharmaceuticals, and Smurfit
WestRock have grounded my engineering in real production environments.
Built production Flask/Python infrastructure for the Replenishment Optimization team. Migrated legacy PHP tools to blueprint architecture, implemented ThreadPoolExecutor multithreading (30 s → 8 s), resolved a 3 GB memory crash via chunked Pandas.
Built and maintained Power BI dashboards and data pipelines for portfolio management. Drove reporting automation across program delivery teams.
Supported project delivery and operations coordination across pharmaceutical manufacturing workflows.
Manufacturing process engineering and quality analysis in a large-scale packaging environment.
Measured threshold voltage shift under body bias. Extracted transconductance and output resistance from I–V curves. Identified subthreshold slope and channel-length modulation.
Characterised forward and reverse I–V curves of silicon diodes. Identified Zener and avalanche breakdown regimes and extracted ideality factor and reverse saturation current.
Measured optical transmission spectra to extract band gap energies. Characterised LED L–I curves and emission spectra using an Ocean Optics FLAME-S spectrometer.
Used hot probe and four-point probe techniques to determine semiconductor type and measure resistivity. Calculated sheet resistance and compared doping concentrations across samples.
Implemented a Forward-Time Centered-Space (FTCS) finite difference scheme in MATLAB to solve the 1D diffusion equation. Analysed stability via the Courant number and validated against analytical solutions.
Analysed plane wave propagation, thin-film interference, and atomic polarisation. Calculated intensity patterns for double-slit and thin-film configurations with phase analysis.